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power semiconductors, Semiconductor Metrology and Inspection

Power Semiconductors

Post Backside Wafer Thinning and Metallization Inspection

advanced process control solutions

NST Series

A Game Changer in Nanotopography

semiconductor manufacturer

4See Series

Multiple orders for Power Semiconductors

UnitySC delivers visionary technologies that foster progress for people. We are recognized as a key player in semiconductor metrology and inspection for heterogeneous integration combining advanced technologies to enable higher yields and faster time to market.

Next event: October 9, 2017 - October 12, 2017

IMAPS 2017

Raleigh, NC
UnitySC will be exhibiting on booth #421 and delivering a talk entitled “In line Advanced Process Control Solution for the Fabrication of Micro-bumps”. Come to meet with us. To pre-arrange a meeting, send us a message.

Leading IDM Selects New 4See Series Automated Defect Inspection Platform for Power Semiconductor Automotive Applications

Grenoble, France, May 9, 2017UnitySC, a leader in advanced inspection and metrology solutions, today announced multiple orders from a leading integrated device manufacturer (IDM) for its modular 4See Series automated defect inspection platform. The systems were selected because they deliver optimal wafer backside surface and edge defect inspection post thinning and metallization. The 4See Series will be used for automotive applications by a market leader in power semiconductor manufacturing to improve the reliability and performance of its products.

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UnitySC delivers visionary technologies that foster progress for people. We are recognized as a key player in inspection and metrology combining advanced technologies to enable higher yields and faster time to market.

phone
+33 (0)456 526 800