+33 (0)456 526 800

A New Era in Process Control

3D Metrology & Inspection

NST Series

A Game Changer in Nanotopography

4See Series

Multiple orders for Power Semiconductors

Next event: July 11, 2017 - July 13, 2017


San Francisco, CA
1 year ago, UnitySC was launched at SEMICON West 2016. What a busy year with so many achievements since July 2016! Stop by our booth to learn about our full advanced process control product portfolio for heterogeneous integration. UnitySC will be exhibiting on the SEMI European Pavilion located on North Hall, booth #6468.

Go to our contact form to arrange a meeting with our team.


Leading IDM Selects New 4See Series Automated Defect Inspection Platform for Power Semiconductor Automotive Applications

Grenoble, France, May 9, 2017UnitySC, a leader in advanced inspection and metrology solutions, today announced multiple orders from a leading integrated device manufacturer (IDM) for its modular 4See Series automated defect inspection platform. The systems were selected because they deliver optimal wafer backside surface and edge defect inspection post thinning and metallization. The 4See Series will be used for automotive applications by a market leader in power semiconductor manufacturing to improve the reliability and performance of its products.

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UnitySC delivers visionary technologies that foster progress for people. We are recognized as a key player in inspection and metrology combining advanced technologies to enable higher yields and faster time to market.

+33 (0)456 526 800