UnitySC delivers visionary technologies that foster progress for people. We are recognized as a key player in inspection and metrology for heterogeneous integration combining advanced technologies to enable higher yields and faster time to market.
Next event: September 20, 2017 - September 22, 2017
3rd edition of the SEMI MEMS and Sensor Summit will take place in Grenoble from Sept 20th to 22nd. Looking for versatile process control solutions compliant with high volume manufacturing ? Stop by our booth #21 to learn about our TMap Series and 4See Series. To pre-arranged a meeting, send us a message.
Latest Press Release: May 9, 2017
Leading IDM Selects New 4See Series Automated Defect Inspection Platform for Power Semiconductor Automotive Applications
Grenoble, France, May 9, 2017 – UnitySC, a leader in advanced inspection and metrology solutions, today announced multiple orders from a leading integrated device manufacturer (IDM) for its modular 4See Series automated defect inspection platform. The systems were selected because they deliver optimal wafer backside surface and edge defect inspection post thinning and metallization. The 4See Series will be used for automotive applications by a market leader in power semiconductor manufacturing to improve the reliability and performance of its products.
RT @Jan_TechSearch: TechSearch International celebrates our 30th Anniversary! So many changes in our industry in the last 30 years!!!
20 September 2017
RT @EE_Engineers: Read the latest EE Web Exclusive! Overcoming thin-wafer inspection challenges for high-volume manufacturing https://t.co/…
25 August 2017
RT @eWLB_Technology: Dr. SW Yoon will be presenting “eWLB FOWLP: Good to Great” at the iNEMI Q3 Webinar on Aug 28 & 29. https://t.co/SIFSIp…
25 August 2017