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A New Era in Process Control

3D Metrology & Inspection

NST Series

A Game Changer in Nanotopography

4See Series

Multiple orders for Power Semiconductors

Next event: May 31, 2017 - June 1, 2017

ECTC

Lake Buena Vista, Florida
ECTC is the premier international conference on microelectronic packaging, components, and systems technology.
UnitySC is proud to be Gold Sponsor of ECTC. We will be exhibiting in booth #219 and showcasing our full product portfolio of advanced process control solutions. Go to our contact form to arrange a meeting with our team and stop by our booth.

https://www.ectc.net/index.cfm

Leading IDM Selects New 4See Series Automated Defect Inspection Platform for Power Semiconductor Automotive Applications

Grenoble, France, May 9, 2017UnitySC, a leader in advanced inspection and metrology solutions, today announced multiple orders from a leading integrated device manufacturer (IDM) for its modular 4See Series automated defect inspection platform. The systems were selected because they deliver optimal wafer backside surface and edge defect inspection post thinning and metallization. The 4See Series will be used for automotive applications by a market leader in power semiconductor manufacturing to improve the reliability and performance of its products.

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UnitySC delivers visionary technologies that foster progress for people. We are recognized as a key player in inspection and metrology combining advanced technologies to enable higher yields and faster time to market.

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+33 (0)456 526 800

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