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  • TMap Series is a versatile metrology solution. TMap Series provides highly accurate and repeatable wafer geometry measurements such as thickness, TTV, shape and flatness on mono and multilayer substrates for all kind of materials. TMap Series was designed to enable the easiest and fastest measurement for the user. TMap Series is available in manual, semi-automatic

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UnitySC delivers visionary technologies that foster progress for people. We are recognized as a key player in inspection and metrology combining advanced technologies to enable higher yields and faster time to market.

phone
+33 (0)456 526 800