Unitysc European Leader in Metrology & Inspection
Innovative Technology and Solution for Semiconductor
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Our Mission is to become Worldwide leader in Process control solutions for advanced applications offering the right cost effective solution with high reliability to our customers
INSPECTIONS
Unitysc offers a wide product range for defect detection down to nanometer range at very high throughput. Full automatic equipment using leading edge technologies are designed to fulfill high volume manufacturing requirements.
METROLOGY
By an extensive mastering of optical technologies,Unitysc metrology equipment offers a unique solution for high accuracy dimentionnal metrology.
SERVICES
For each customer project, Unitysc offers a shared detailed project analysis including application, process and hardware.
Let’s discover the company solutions
High-precision offer at the cutting edge of technology, personalized support, services and flawless quality are the values that Unitysc wishes to share with you.
Let’s build together the technology of tomorrow around the world !
What’s new
Press releases
LIGHTSpEED by UNiTYSC: The new high-end surface inspection solution for in-line monitoring and process qualification of opaque and transparent substrates
The LIGHTSpEED is the first unpatterned surface inspection solution that combines darkfield inspection and advanced synchronous doppler detection technology to capture nanometer scale defects on all kind of wafers. Grenoble, France – Tuesday, July 9th, 2019 – UnitySC,...
Unity-SC Demonstrates Its Unique Capability to Detect Non-scattering Potential Killer Defects on GaAs Substrates with Major VCSEL Manufacturer
Together with a key player in the VCSEL market, Unity-SC was able to improve their yield by sorting out wafers that presented defects only visible using the LIGHTsEE PSD™. If not detected, these defects can lead to failure later in the process or after system...
Events
ASMC Conference – Optical profilometry and AFM measurements comparison on low amplitude deterministic surfaces
Dr Carlos Beitia from CEA LETI has presented a paper about advanced metrology in collaboration with Unity during the Advanced Semiconductor Manufacturing Conference in New york. New York, 6th-9th May 2019- Surface nanotopography is important for different key advanced...
UnitySC will participate to the MINaPAD forum conferences
MiNaPAD, the « Micro/Nano-Electronics Packaging & Assembly, Design and Manufacturing Forum » is a 2 days conference with an exhibition, which be held in Grenoble, France, on WTC congress center on May 21-22-23, 2019. The objective of this event is to reinforce the...
News
LIGHTSpEED by UNiTYSC: The new high-end surface inspection solution for in-line monitoring and process qualification of opaque and transparent substrates
The LIGHTSpEED is the first unpatterned surface inspection solution that combines darkfield inspection and advanced synchronous doppler detection technology to capture nanometer scale defects on all kind of wafers. Grenoble, France – Tuesday, July 9th, 2019 – UnitySC,...
Unity-SC Demonstrates Its Unique Capability to Detect Non-scattering Potential Killer Defects on GaAs Substrates with Major VCSEL Manufacturer
Together with a key player in the VCSEL market, Unity-SC was able to improve their yield by sorting out wafers that presented defects only visible using the LIGHTsEE PSD™. If not detected, these defects can lead to failure later in the process or after system...